Key dates

  • Abstract submission deadline extended:
    29 January 2016
  • Early registration deadline:
    4 March 2016
  • Registration deadline:
    31 March 2016

Invited speakers

Plenary speakers


Professor Paul Midgley, University of Cambridge, UK

Paul Midgley is Professor of Materials Science and Director of the Electron Microscopy Facility. He is a Fellow of the Royal Society and a Professorial Fellow at Peterhouse. Before moving to Cambridge in 1997, he held two Research Fellowships in the H.H. Wills Physics Laboratory at the University of Bristol, the first funded by The Royal Commission for The Exhibition of 1851 and the second by The Royal Society. He has studied a wide variety of materials by electron microscopy and developed a number of novel electron microscopy techniques. His recent research has concentrated on electron tomography, electron holography, energy filtered TEM and precession electron diffraction.

Professor Ferdinand Hofer, Graz University of Technology, Austria

Ferdinand Hofer is Professor and Director of the Institute for Electron Microscopy and Nanoanalysis and Director of the privately organised Graz Centre for Electron Microscopy. He started his research career as a PhD student in Physical Chemistry at the Graz University of Technology and moved to the Institute for Electron Microscopy in 1982 concentrating on the development and application of analytical transmission electron microscopy. After his habilitation in Graz in 1989 he established a research group for electron energy-loss spectrometry and energy-filtering TEM. He became a Professor and Director of the Institute in 2000. He is also Vice President of the Austrian Society for Electron Microscopy and Head of the Alumni organisation of the Graz University of Technology.

His recent research focuses on atomic resolution STEM and electron energy-loss spectrometry and applications in the physical sciences (quantification methods and plasmonic properties).

Professor Alan Craven, University of Glasgow, UK

Alan Craven started his research career as a PhD student of Archie Howie in the Cavendish Laboratory, where he built a UHV field emission scanning electron microscope for surface studies.  He then became the PDRA in charge of the first VG HB5 in the Cavendish before taking up a Lectureship at Glasgow University.   He subsequently became Senior Lecturer, Reader and Professor and latterly led the Solid State Physics Research Group there before retiring in 2012.   His research continued to focus on developing instrumentation and techniques for STEM-EELS and applying them to a wide range of materials systems.   He is now Professor Emeritus and Senior Honorary Research Fellow there.   During his career, he was Secretary and Chair of the EMAG Committee, Secretary of BJCEM, a member of RMS Council, a member of the Executive Council of IFSM and a member of the SuperSTEM Management Committee.

Invited speakers

Professor Richard Beanland, University of Warwick, UK

Richard Beanland’s research interests involve all forms of electron microscopy (TEM, SEM, FIB/SEM, etc.), electron diffraction, Bloch wave simulations, functional ceramics, semiconductor materials and devices, crystallography

Oct 2008-present: Reader, The University of Warwick, Department of Physics

Oct 2007-Sep 2008: Research Fellow, University of Cambridge, Department of Materials Science and Metallurgy - Electron microscopy


Professor Andreas Rosenauer, University of Bremen, Germany

Bremen University, Institute of Solid State Physics-Electron Microscopy, Germany

Dr. Andreas Rosenauer leads the Electron Microscopy group at the Solid State Physics institute of the University of Bremen since 2004. After his habilitation in Karlsruhe in 2001 he was guest-professor and then ordinary professor at the EMAT research-center in Antwerp. His work group focuses on development and application of quantitative methods in transmission electron microscopy. He started with measurement of strain by DALI (digital analysis of latticeimages), developed the CELFA (composition evaluation by lattice fringe analysis) method and then turned towards quantitative STEM. He is author of the STEMsim program which for instance was applied to analysis of composition based on comparison of experimental STEM intensity with simulation. Recently, his group contributed to measurement of atomic electric fields and developed the ISTEM (imaging STEM) method allowing image resolution beyond the diffraction and information limits.

Dr Raul Arenal, Universite de Zaragoza, Spain

Dr. Raul Arenal received his Ph.D. in Solid State Physics from Univ. Paris-Sud (Orsay, France, 2005) and in 2013, he obtained his Habilitation (HDR) also at this university. In 2007, he became research scientist (charge de recherches) at the CNRS (France), working at the LEM, CNRS-ONERA (Chatillon, France). Since 2012, Dr. Arenal is on leave from the CNRS and he is currently ARAID research scientist at the LMA - Instituto de Nanociencia de Aragon (INA) of the Universidad de Zaragoza (Spain). He has published more than 150 peer-reviewed contributions. His broad area of research interest lies in electron microscopy focused on materials science and nanoscience: TEM (EELS, HR(S)TEM, electron diffraction, electron tomography). These studies are mainly focused on the growth mechanism, structural and physical (electronic, optical, vibrational, mechanical) properties of nanomaterials based on carbon, boron and nitrogen as well as other nano-structures (in particular, metallic nano-objects for plasmonic/photonic interest). Among his scientific activities, Dr. Arenal is the promoter and chair of HeteroNanoCarb13 and HeteroNanoCarb15 ( conferences focused on graphene, NT and related 1D-2D nanomaterials.

Dr Jan Rusz, Uppsala University, Sweden

Ján Rusz has graduated in physics at the University of Pavol Jozef Šafárik in Košice, Slovakia, after which he pursued his PhD studies at the Charles University in Prague, Czech Republic, receiving the degree in 2005. In 2010 he became an assistant professor at the Department of Physics and Astronomy of Uppsala University, Sweden.

He works on theory and simulations of inelastic electron scattering on crystalline materials. His primary research focus is development of electron magnetic circular dichroism in TEM and STEM, allowing measurement of magnetic properties of materials with very high spatial resolution, aiming towards atomic resolution.